EIS Audit Studio
Review impedance spectra, then inspect ECM fits and conditional Lin-KK diagnostics with the included advanced local module. Keep source measurements with your results.
Inspect impedance spectra, summarize formation records, compare production tests with specifications, and review materials-test endpoints. Four focused tools keep calculations, review flags and measurement context together.
Conceptual electrode illustrationAn analysis should tell you where a value came from, what was assumed and what needs a human review.
Review identifiers, units and the conventions required by each workflow before interpreting a measurement.
Examine missing-data, inconsistency and duplicate-record flags within each tool's documented scope.
Derive well-defined quantities with transparent units and scope limits.
Present review flags alongside preserved source records so your team can investigate and decide.
SCOPE MATTERS - Available tools and scientific evidence vary by module. See validation and known limitations.
Four interactive domain examples using deterministic, synthetic reference values. Explore the axes and labels before you explore the product.
Illustrative RC reference spectrum.
Rₛ = 42 mΩInspect an openly published EIS reference spectrum in your browser. Follow measured impedance points through explicit imaginary-sign handling, Nyquist and Bode views, and basic integrity flags. See the product scope for the analyses included.
Inspect open reference dataset
Source: Keysight / SINTEF 21700 NMC811 30% SoC, DOI 10.5281/zenodo.15422339. The reference dataset is separate from any customer files.

Choose the task you need to investigate. Each tool has its own inputs, outputs and documented methods. The suites cover all four tools under one shared named-user entitlement, without automatic cross-tool data transfer.
Review impedance spectra, then inspect ECM fits and conditional Lin-KK diagnostics with the included advanced local module. Keep source measurements with your results.
Summarize positive and negative Ah/Wh throughput from current, voltage and time records. Review excluded intervals, time-order issues and peak temperature among valid retained samples.
Compare batches and metrics with declared specifications. Review out-of-spec observations, duplicate identifiers and potential outliers alongside the source records.
Summarize dimensional growth and mass loss per exposed area and time. Keep replicates, exposure durations and declared test conditions separate.
Designed for additional scientific modules as methods, independent evidence and licensing rights are established.

Formation coverage, lot specifications, grid-alloy experiments and EIS measurements. A Factory Data Review Pilot focuses on one agreed question and a bounded historical dataset.
Discuss your factory dataFrom CAD 1,500, subject to agreed scope, price and terms. One data-quality review, reproducible descriptive analysis, engineering report and readout.
A documented review for your engineers, with findings and next steps tied to the agreed dataset.
View a synthetic sample reportReview the measurement, the calculation and the interpretation together. Documented assumptions and review flags make the reasoning open to scrutiny.
Schematic of the research and engineering review workflow.
Try the public previews to inspect the calculations. Local ZIP packages provide larger configured input limits and JSON/CSV export controls. Exact-package acceptance across operating systems remains incomplete; no blanket platform certification is claimed. Individual and laboratory licenses differ in permitted users, not scientific accuracy.
Purchase core-tool licenses through Payhip.